2023/10/18 16:49:17
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· Members of the Texas Instruments SCOPE ?
· Family of Testability Products
· Octal Test-Integrated Circuits
· Functionally Equivalent to ’F374 and ’BCT374 in the Normal-Function Mode
· Compatible With the IEEE Standard 1149.1-1990 (JTAG) Test Access Port and Boundary-Scan Architecture
· Test Operation Synchronous to Test Access Port (TAP)
· Implement Optional Test Reset Signal by Recognizing a Double-High-Level Voltage (10 V) on TMS Pin
· SCOPE ?
· Instruction Set
? IEEE Standard 1149.1-1990 Required Instructions, Optional INTEST, CLAMP, and HIGHZ
? Parallel-Signature Analysis at Inputs
? Pseudo-Random Pattern Generation From Outputs
? Sample Inputs/Toggle Outputs
· Package Options Include Plastic Small-Outline (DW) Packages, Ceramic Chip Carriers (FK), and Standard Plastic (NT) and Ceramic (JT) 300-mil DIPs
Description
The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE? testability integrated-circuit family. This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.
In the normal mode, these devices are functionally equivalent to the ’F374 and ’BCT374 octal D-type flip-flops. The test circuitry can be activated by the TAP to take snapshot samples of the data appearing at the device terminals or to perform a self test on the boundary-test cells. Activating the TAP in normal mode does not affect the functional operation of the SCOPE? octal flip-flops.
n the test mode, the normal operation of the SCOPE? octal flip-flops is inhibited and the test circuitry is enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry can perform boundary-scan test operations as described in IEEE Standard 1149.1-1990.
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